Home    Wafer Inspection Series    Wafer Visual Inspection Sorter
图片29

Wafer Visual Inspection Sorter

·can realize 8/12 inch wafer sorting;


·high power microscope and CCD vision system are configured to check the defects on the front and back of the wafer;


·is compatible with Foup/Open Cassette;


·Visual operation, dual-display interface, easy to operate;


·software system with MES module can be seamlessly linked with CIM system.