Home    Wafer Inspection Series    Wafer Inspection and Transfer System

Wafer Inspection and Transfer System

·can correspond to wafers of various sizes and materials;

·Based on MES system, WAFER is transmitted and positioned through SECS/GEM transmission command or manual input command, which is compatible with various communication protocols and can be matched with various detection equipment;

·is compatible with multiple communication protocols and is seamless and easy to connect.